VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Författare
(Edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis.)
Språk
Engelska
Förlag År Ort Om boken ISBN
Springer International Publishing, Imprint: Springer 2016 Tyskland, Cham XIII, 223 sidor. 121 illus. online resource. 978-3-319-46097-0